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2009 16th Working Conference on Reverse Engineering
Relating Identifier Naming Flaws and Code Quality: An Empirical Study
Lille, France
October 13-October 16
ISBN: 978-0-7695-3867-9
ASCII Text
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Simon Butler, Michel Wermelinger, Yijun Yu, Helen Sharp, "Relating Identifier Naming Flaws and Code Quality: An Empirical Study," Reverse Engineering, Working Conference on, pp. 31-35, 2009 16th Working Conference on Reverse Engineering, 2009.
 
 
BibTex
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@article{ 10.1109/WCRE.2009.50,
author = {Simon Butler and Michel Wermelinger and Yijun Yu and Helen Sharp},
title = {Relating Identifier Naming Flaws and Code Quality: An Empirical Study},
journal ={Reverse Engineering, Working Conference on},
volume = {0},
year = {2009},
issn = {1095-1350},
pages = {31-35},
doi = {http://doi.ieeecomputersociety.org/10.1109/WCRE.2009.50},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Reverse Engineering, Working Conference on
TI - Relating Identifier Naming Flaws and Code Quality: An Empirical Study
SN - 1095-1350
SP31
EP35
A1 - Simon Butler,
A1 - Michel Wermelinger,
A1 - Yijun Yu,
A1 - Helen Sharp,
PY - 2009
KW - programming
KW - software metrics
KW - software quality
VL - 0
JA - Reverse Engineering, Working Conference on
ER -
 
Studies have demonstrated the importance of good identifier names to program comprehension. It is unclear, however, whether poor naming has other effects that might impact maintenance effort, e.g. on code quality. We evaluated the quality of identifier names in 8 established open source Java applications libraries, using a set of 12 identifier naming guidelines. We found statistically significant associations between flawed identifiers (i.e. violating at least one guideline) and code quality issues reported by FindBugs, a static analysis tool.
Index Terms:
programming, software metrics, software quality
Citation:
Simon Butler, Michel Wermelinger, Yijun Yu, Helen Sharp, "Relating Identifier Naming Flaws and Code Quality: An Empirical Study," wcre, pp.31-35, 2009 16th Working Conference on Reverse Engineering, 2009
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