loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
12th Working Conference on Reverse Engineering (WCRE 2005)
Design Pattern Detection in Eiffel Systems
Pittsburgh, Pennsylvania
November 07-November 11
ISBN: 0-7695-2474-5
ASCII Text
x 
 
Wei Wang, Vassilios Tzerpos, "Design Pattern Detection in Eiffel Systems," Reverse Engineering, Working Conference on, pp. 165-174, 12th Working Conference on Reverse Engineering (WCRE 2005), 2005.
 
 
BibTex
x
 
@article{ 10.1109/WCRE.2005.14,
author = {Wei Wang and Vassilios Tzerpos},
title = {Design Pattern Detection in Eiffel Systems},
journal ={Reverse Engineering, Working Conference on},
volume = {0},
year = {2005},
issn = {1095-1350},
pages = {165-174},
doi = {http://doi.ieeecomputersociety.org/10.1109/WCRE.2005.14},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - Reverse Engineering, Working Conference on
TI - Design Pattern Detection in Eiffel Systems
SN - 1095-1350
SP165
EP174
A1 - Wei Wang,
A1 - Vassilios Tzerpos,
PY - 2005
KW - null
VL - 0
JA - Reverse Engineering, Working Conference on
ER -
 
Wei Wang, York University
Vassilios Tzerpos, York University

The use of design patterns in a software system can provide strong indications about the rationale behind the system?s design. As a result, automating the detection of design pattern instances could be of significant help to the process of reverse engineering large software systems.

In this paper, we introduce DPVK (Design Pattern Verification toolKit), the first reverse engineering tool to detect pattern instances in Eiffel systems. DPVK is able to detect several different design patterns by examining both the static structure and the dynamic behaviour of a system written in Eiffel. We present three case studies that were performed to assess DPVK?s effectiveness.

Citation:
Wei Wang, Vassilios Tzerpos, "Design Pattern Detection in Eiffel Systems," wcre, pp.165-174, 12th Working Conference on Reverse Engineering (WCRE 2005), 2005
Usage of this product signifies your acceptance of the Terms of Use.