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26th IEEE VLSI Test Symposium (vts 2008)
Diagnosis of Scan Clock Failures
April 27-May 01
ISBN: 0-7695-3123-7
ASCII Text
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King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman, "Diagnosis of Scan Clock Failures," VLSI Test Symposium, IEEE, pp. 67-72, 26th IEEE VLSI Test Symposium (vts 2008), 2008.
 
 
BibTex
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@article{ 10.1109/VTS.2008.59,
author = {King Leong Lee and Nadir Z. Basturkmen and Srikanth Venkataraman},
title = {Diagnosis of Scan Clock Failures},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2008},
issn = {1093-0167},
pages = {67-72},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.59},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Diagnosis of Scan Clock Failures
SN - 1093-0167
SP67
EP72
A1 - King Leong Lee,
A1 - Nadir Z. Basturkmen,
A1 - Srikanth Venkataraman,
PY - 2008
KW - diagnosis
KW - scan clock
KW - scan chain
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
In this paper we present a fault diagnosis procedure for defects in the scan clock tree. We first identify the candidate clock tree buffers common to failing chains by backtracing. We then evaluate and rank these candidates by forward tracing and simulation. Experimental results show that the proposed procedure provides accurate diagnosis of scan clock failures.
Index Terms:
diagnosis, scan clock, scan chain
Citation:
King Leong Lee, Nadir Z. Basturkmen, Srikanth Venkataraman, "Diagnosis of Scan Clock Failures," vts, pp.67-72, 26th IEEE VLSI Test Symposium (vts 2008), 2008
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