Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems

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26th IEEE VLSI Test Symposium (vts 2008)

April 27-May 01

ISBN: 0-7695-3123-7

	ASCII Text	x
	Qingqi Dou, Jacob A. Abraham, "Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems," VLSI Test Symposium, IEEE, pp. 3-8, 26th IEEE VLSI Test Symposium (vts 2008), 2008.

	BibTex	x
	@article{ 10.1109/VTS.2008.57, author = {Qingqi Dou and Jacob A. Abraham}, title = {Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2008}, issn = {1093-0167}, pages = {3-8}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.57}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems SN - 1093-0167 SP3 EP8 A1 - Qingqi Dou, A1 - Jacob A. Abraham, PY - 2008 KW - Time-Interleaved ADC KW - Mixed-signal testing KW - Low-cost test KW - Timing Mismatch KW - High speed testing VL - 0 JA - VLSI Test Symposium, IEEE ER -

Qingqi Dou

Jacob A. Abraham

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2008.57

Time Interleaved A/D Converters (TIADCs)provide an attractive solution to the realization of analogfront ends in high speed communication systems. However,gain mismatch, offset mismatch, and sampling time mismatchbetween time-interleaved channels limit the performanceof TIADCs. This paper presents a low-cost test scheme tomeasure timing mismatch using an undersampling clock. Ourmethod is applicable to an arbitrary number of channels,achieving picosecond resolution with low power consumption.Both simulation and hardware measurements are presented tovalidate the proposed technique.

Index Terms:

Time-Interleaved ADC, Mixed-signal testing, Low-cost test, Timing Mismatch, High speed testing

Citation:

Qingqi Dou, Jacob A. Abraham, "Low-cost Test of Timing Mismatch Among Time-Interleaved A/D Converters in High-speed Communication Systems," vts, pp.3-8, 26th IEEE VLSI Test Symposium (vts 2008), 2008

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