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26th IEEE VLSI Test Symposium (vts 2008)
A Time-Domain Method for Pseudo-Spectral Characterization
April 27-May 01
ISBN: 0-7695-3123-7
ASCII Text
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Apurva Mishra, Mani Soma, "A Time-Domain Method for Pseudo-Spectral Characterization," VLSI Test Symposium, IEEE, pp. 163-168, 26th IEEE VLSI Test Symposium (vts 2008), 2008.
 
 
BibTex
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@article{ 10.1109/VTS.2008.50,
author = {Apurva Mishra and Mani Soma},
title = {A Time-Domain Method for Pseudo-Spectral Characterization},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2008},
issn = {1093-0167},
pages = {163-168},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.50},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - A Time-Domain Method for Pseudo-Spectral Characterization
SN - 1093-0167
SP163
EP168
A1 - Apurva Mishra,
A1 - Mani Soma,
PY - 2008
KW - mixed-signal test
KW - analog test
KW - bist
KW - fft
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
We present a generic method for determining transfer function of a DUT using simple time-domain computations in place of conventional computationally intensive frequency domain methods. Our method uses a chirp stimulus and an average of absolute value to extract energy in different frequency bins. For an N0-size spectrum, this enables a reduction of computational complexity from N0*ln(N0) multiply-accumulates (using an FFT) to N0 accumulates. This makes it an attractive strategy for BIST. We present the theoretical basis, test case simulations, and a comparison with the FFT method.
Index Terms:
mixed-signal test, analog test, bist, fft
Citation:
Apurva Mishra, Mani Soma, "A Time-Domain Method for Pseudo-Spectral Characterization," vts, pp.163-168, 26th IEEE VLSI Test Symposium (vts 2008), 2008
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