A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates

V
VTS
2008
26th IEEE VLSI Test Symposium (vts 2008)
Abstract - A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates

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26th IEEE VLSI Test Symposium (vts 2008)

April 27-May 01

ISBN: 0-7695-3123-7

	ASCII Text	x
	Manoj Kumar Goparaju, Spyros Tragoudas, "A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates," VLSI Test Symposium, IEEE, pp. 323-328, 26th IEEE VLSI Test Symposium (vts 2008), 2008.

	BibTex	x
	@article{ 10.1109/VTS.2008.43, author = {Manoj Kumar Goparaju and Spyros Tragoudas}, title = {A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2008}, issn = {1093-0167}, pages = {323-328}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.43}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates SN - 1093-0167 SP323 EP328 A1 - Manoj Kumar Goparaju, A1 - Spyros Tragoudas, PY - 2008 KW - Threshold logic KW - Weght defects KW - Parametric faults KW - ATPG VL - 0 JA - VLSI Test Symposium, IEEE ER -

Manoj Kumar Goparaju

Spyros Tragoudas

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2008.43

The gate that is implemented with threshold logic is called a Threshold Logic Gate (TLG). The logic output value of an TLG depends on the weighted sum of its inputs. Manufactured weights in the threshold logic gates (TLGs) may differ from the designed values and significantly affects the fault coverage. A novel Automatic Test Pattern Generation (ATPG) tool is proposed to detect whether the circuit is malfunctioning due to such weight-related defects.

Index Terms:

Threshold logic, Weght defects, Parametric faults, ATPG

Citation:

Manoj Kumar Goparaju, Spyros Tragoudas, "A Novel ATPG Framework to Detect Weight Related Defects in Threshold Logic Gates," vts, pp.323-328, 26th IEEE VLSI Test Symposium (vts 2008), 2008

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