26th IEEE VLSI Test Symposium (vts 2008) Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation April 27-May 01 ISBN: 0-7695-3123-7
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2008.42
Recently, an X-canceling MISR methodology was proposed in [Touba 07] which was based on providing very high probabilistic error coverage by canceling out X's in MISR signatures. This paper investigates a new methodology for using the x-canceling MISR architecture based on deterministically observing scan cells. The two main advantages of the proposed approach are (1) it can provide a higher amount of compaction, and (2) it is effective for larger percentages of X's in the output response. Also, this paper investigates a hybrid approach that combines X-masking with an X-canceling MISR. Experimental results indicate that significant amounts of output compression can be achieved with no loss of fault coverage.
Index Terms:
X-tolerant, Response Compaction, Linear Compression, Gaussian Elimination
Citation:
Ritesh Garg, Richard Putman, Nur A. Touba, "Increasing Output Compaction in Presence of Unknowns Using an X-Canceling MISR with Deterministic Observation," vts, pp.35-42, 26th IEEE VLSI Test Symposium (vts 2008), 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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