26th IEEE VLSI Test Symposium (vts 2008) Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers April 27-May 01 ISBN: 0-7695-3123-7
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2008.39
This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system, such as I/Q mismatch, baseband/RF time skew, and DC offsets. The proposed method is capable of separating the transmitter parameters from the receiver parameters in a single measurement. Digital baseband signals are used as test input and the received I/Q baseband signals are analyzed for parameter extraction. Experimental results show that the test method has 1.5\% RMS error performance inthe presence of thermal noise and unknown delays caused by the loop-back connection. The test technique can easily be implemented on a digital tester. Either on-chip baseband data converters or load board data converters (for transceiver circuits without digital output) can be used for interfacing the transceiver circuit under test.
Index Terms:
RF Transceivers, I/Q modulation, I/Q mismatch, Time skew
Citation:
Erdem Serkan Erdogan, Sule Ozev, "Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers," vts, pp.209-214, 26th IEEE VLSI Test Symposium (vts 2008), 2008 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||