loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
26th IEEE VLSI Test Symposium (vts 2008)
Test Enabled Process Tuning for Adaptive Baseband OFDM Processor
April 27-May 01
ISBN: 0-7695-3123-7
As channel conditions in wireless communications improve, the noise performance of the baseband DSP processor can be degraded to save power without compromising bit error rate. The degradation of baseband signal noise is achieved by degrading the noise performance (reducing the wordlength and supply voltage) of the various baseband signal processing modules in specific proportions defined by a locus, that ensures minimum overall power consumption for a given channel. In the presence of intra-die process variations, this locus is determined by the delay/leakage parameters of each baseband module. In our approach, a path oscillation test applied to each module is used to select the "best" locus of choice and an EVM driven feedback loop is used to dynamically modulate the wordlength/power consumption of each module as dictated by this locus to minimize power and modulate baseband SNR across a range of channel conditions.
Index Terms:
Low power, OFDM, Adaptive Signal Scaling, Timing test
Citation:
Muhammad Mudassar Nisar, Abhijit Chatterjee, "Test Enabled Process Tuning for Adaptive Baseband OFDM Processor," vts, pp.9-16, 26th IEEE VLSI Test Symposium (vts 2008), 2008
Usage of this product signifies your acceptance of the Terms of Use.