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26th IEEE VLSI Test Symposium (vts 2008)
A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies
April 27-May 01
ISBN: 0-7695-3123-7
ASCII Text
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Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi, "A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies," VLSI Test Symposium, IEEE, pp. 275-282, 26th IEEE VLSI Test Symposium (vts 2008), 2008.
 
 
BibTex
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@article{ 10.1109/VTS.2008.12,
author = {Masoud Hashempour and Zahra Mashreghian Arani and Fabrizio Lombardi},
title = {A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2008},
issn = {1093-0167},
pages = {275-282},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.12},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
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TY - CONF
JO - VLSI Test Symposium, IEEE
TI - A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies
SN - 1093-0167
SP275
EP282
A1 - Masoud Hashempour,
A1 - Zahra Mashreghian Arani,
A1 - Fabrizio Lombardi,
PY - 2008
KW - Error Tolerance
KW - Puncturing
KW - DNA Self-Assembly
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
This paper presents a novel metric by which the effectiveness of punctures (as corrective action for error tolerance) can be assessed with respect to tile sets for DNA selfassembly in nano-manufacturing. Initially, the conditions for correct binding of a tile to an existing aggregate are analyzed using a Markovian approach; based on this analysis, it is proved that correct aggregation (as identified with a so-called Ideal Tile Set) is not always met for existing tile sets for nano-manufacturing. Hence, a metric is proposed for assessing tile sets by utilizing punctures. Tile sets are investigated and assessed with respect to features such error(mismatched tile) movement, punctured area and bondtypes. Subsequently, it is shown that the proposed metriccan comprehensively assess the effectiveness of a type of apuncture for a tile set and its capability to attain error tolerance for the desired pattern. Extensive simulation results are provided.
Index Terms:
Error Tolerance, Puncturing, DNA Self-Assembly
Citation:
Masoud Hashempour, Zahra Mashreghian Arani, Fabrizio Lombardi, "A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies," vts, pp.275-282, 26th IEEE VLSI Test Symposium (vts 2008), 2008
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