Session Abstract

V
VTS
2006
24th IEEE VLSI Test Symposium
Abstract - Session Abstract

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24th IEEE VLSI Test Symposium

Session Abstract (PDF)

Berkeley, California

April 30-May 04

ISBN: 0-7695-2514-8

	ASCII Text	x
	Michael Nicolaidis, "Session Abstract," VLSI Test Symposium, IEEE, pp. 286-287, 24th IEEE VLSI Test Symposium, 2006.

	BibTex	x
	@article{ 10.1109/VTS.2006.79, author = {Michael Nicolaidis}, title = {Session Abstract}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {286-287}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.79}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Session Abstract SN - 0-7695-2514-8 SP286 EP287 A1 - Michael Nicolaidis, PY - 2006 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Michael Nicolaidis, TIMA Labs & iRoC Technologies

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.79

Three soft-error experts from industry will discuss the way their companies understand the impact of soft-errors on electronic systems, whether they consider soft-errors as an already existing or upcoming risk, whether they use or intent to introduce countermeasures and which are the best suited ones for their applications.

Citation:

Michael Nicolaidis, "Session Abstract," vts, pp.286-287, 24th IEEE VLSI Test Symposium, 2006

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