Large designs, larger test pattern volumes and longer test times have necessitated the use of test data and test time compression techniques built around the scan design paradigm. The adoption of these techniques is increasing. Much as well as they are understood today, these techniques continue to present challenges in their adoption and implementation. As their adoption increases, new compression targets are set, in turn forcing the investigation of better solutions and upper bounds. In this Innovative Practices track session, implementation case studies for various scan compression techniques will be presented, together with their tradeoffs and entitlement. Emerging developments in these technologies will be described, together with some theoretical results and possibilities.