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24th IEEE VLSI Test Symposium
Berkeley, California
April 30-May 04
ISBN: 0-7695-2514-8
Andr? Ivanov, University of British Columbia
Design technologies for silicon-based integrated systems present unprecedented advantages and challenges, the former being related to the very high device density and the latter the increased presence of defects. In 45nm CMOS, in a single system on chip (SoC) over a thousand microprocessor cores, or modules of comparable complexity, may be integrated. On the other hand using System-in-Package (SiP) technology separate chips can be packaged together into a system with a very small form factor using a common 2D or 3D substrate. It is most suitable for the integration of heterogeneous technologies where single-chip integration is difficult or too expensive to pursue.
Citation:
Andr? Ivanov, "Session Abstract," vts, pp.424-425, 24th IEEE VLSI Test Symposium, 2006
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