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24th IEEE VLSI Test Symposium

Session Abstract (PDF)

Berkeley, California

April 30-May 04

ISBN: 0-7695-2514-8

	ASCII Text	x
	Kee Sup Kim, Mohammad Tehranipoor, "Session Abstract," VLSI Test Symposium, IEEE, pp. 292-293, 24th IEEE VLSI Test Symposium, 2006.

	BibTex	x
	@article{ 10.1109/VTS.2006.66, author = {Kee Sup Kim and Mohammad Tehranipoor}, title = {Session Abstract}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {292-293}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.66}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Session Abstract SN - 0-7695-2514-8 SP292 EP293 A1 - Kee Sup Kim, A1 - Mohammad Tehranipoor, PY - 2006 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Kee Sup Kim, Intel

Mohammad Tehranipoor, UMBC

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.66

In the course of practicing DFT and test engineering, we make a number of engineering decisions since full set of data are not available. In academia, researchers search for the next big problem and struggle to get access to the real data. What are these missing data and what effects would they have if they were known?

Citation:

Kee Sup Kim, Mohammad Tehranipoor, "Session Abstract," vts, pp.292-293, 24th IEEE VLSI Test Symposium, 2006

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