24th IEEE VLSI Test Symposium Robust Test Generation for Precise Crosstalk-induced Path Delay Faults Berkeley, California April 30-May 04 ISBN: 0-7695-2514-8
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.60
Crosstalk-induced delay should be tested for highspeed circuits. We propose a robust test generation technique based on a single precise crosstalk-induced path delay fault model, S-PCPDF model. The path sensitization criterion of robust test generation for a target S-PCPDF is defined separately for sensitizing the path under test and sensitizing the sub-path to propagate aggressor transitions. Experimental results showed that the proposed technique can be applied to circuits of reasonable sizes within an acceptable time. The average test efficiency is high.
Citation:
Huawei Li, Peifu Shen, Xiaowei Li, "Robust Test Generation for Precise Crosstalk-induced Path Delay Faults," vts, pp.300-305, 24th IEEE VLSI Test Symposium, 2006 Usage of this product signifies your acceptance of the Terms of Use. | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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