Functional Test of Field Programmable Analog Arrays

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	Similar Articles Articles by T. R. Balen Articles by J.V. Calvano Articles by M. S. Lubaszewski Articles by M. Renovell

24th IEEE VLSI Test Symposium

Berkeley, California

April 30-May 04

ISBN: 0-7695-2514-8

	ASCII Text	x
	T. R. Balen, J.V. Calvano, M. S. Lubaszewski, M. Renovell, "Functional Test of Field Programmable Analog Arrays," VLSI Test Symposium, IEEE, pp. 326-333, 24th IEEE VLSI Test Symposium, 2006.

	BibTex	x
	@article{ 10.1109/VTS.2006.37, author = {T. R. Balen and J.V. Calvano and M. S. Lubaszewski and M. Renovell}, title = {Functional Test of Field Programmable Analog Arrays}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {326-333}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.37}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Functional Test of Field Programmable Analog Arrays SN - 0-7695-2514-8 SP326 EP333 A1 - T. R. Balen, A1 - J.V. Calvano, A1 - M. S. Lubaszewski, A1 - M. Renovell, PY - 2006 KW - FPAA KW - analog built-in self-test KW - transient response analysis VL - 0 JA - VLSI Test Symposium, IEEE ER -

T. R. Balen, Universidade Federal do Rio Grande do Sul, Brazil

J.V. Calvano, Instituto de Pesquisas da Marinha do Brasil, Brazil

M. S. Lubaszewski, Universidade Federal do Rio Grande do Sul, Brazil

M. Renovell, Universit? de Montpellier II, France

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.37

In this work a strategy for testing analog networks, known as Transient Response Analysis Method, is applied to test the Configurable Analog Blocks (CABs) of Field Programmable Analog Arrays (FPAAs). In this method the Circuit Under Test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks to known input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between fault-free and faulty CABs. Different functions available in the component programming library are studied and a choice is made in order to obtain the best results in terms of sensitivity and test coverage. A functional fault model based on high-level parameters of the transfer function of the programmed blocks is adopted and the relationship between these parameters and CAB component deviations is investigated, therefore allowing to estimate the fault coverage and test application time of the proposed functional test method.

Index Terms:

FPAA, analog built-in self-test, transient response analysis

Citation:

T. R. Balen, J.V. Calvano, M. S. Lubaszewski, M. Renovell, "Functional Test of Field Programmable Analog Arrays," vts, pp.326-333, 24th IEEE VLSI Test Symposium, 2006

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