Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes

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24th IEEE VLSI Test Symposium

Berkeley, California

April 30-May 04

ISBN: 0-7695-2514-8

	ASCII Text	x
	Rong Zhang, Zeljko Zilic, Katarzyna Radecka, "Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes," VLSI Test Symposium, IEEE, pp. 186-191, 24th IEEE VLSI Test Symposium, 2006.

	BibTex	x
	@article{ 10.1109/VTS.2006.32, author = {Rong Zhang and Zeljko Zilic and Katarzyna Radecka}, title = {Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2006}, isbn = {0-7695-2514-8}, pages = {186-191}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.32}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes SN - 0-7695-2514-8 SP186 EP191 A1 - Rong Zhang, A1 - Zeljko Zilic, A1 - Katarzyna Radecka, PY - 2006 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Rong Zhang, McGill University, Canada

Zeljko Zilic, McGill University, Canada

Katarzyna Radecka, Concordia University, Canada

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2006.32

We consider self-testing of complete wireless nodes in the field through a low-energy software-based selftest (SBST) method. Energy consumption is optimized both for individual components such as a CPU, embedded memories, and an RF module, as well as at the system level, considering the interplay between module tests. We first derive a scheme for softwarebased tests with the least amount of cycles and with operands of least Hamming distance and weight. Time interleaving of module tests at the system level further reduces the overall test energy consumption.

Citation:

Rong Zhang, Zeljko Zilic, Katarzyna Radecka, "Energy Efficient Software-Based Self-Test for Wireless Sensor Network Nodes," vts, pp.186-191, 24th IEEE VLSI Test Symposium, 2006

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