24th IEEE VLSI Test Symposium
Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations
Berkeley, California
April 30-May 04
ISBN: 0-7695-2514-8
Monte Carlo analysis has so far been the corner stone for analog statistical simulations. Fast and accurate simulations are necessary for stringent time-to-market, design for manufacturability and yield concerns in the analog domain. Although Monte Carlo attains accuracy, it does so with a sacrifice in run-time for analog simulations. In this paper, we propose a fast and accurate probabilistic simulation method alternative to Monte Carlo using deterministic sampling and weight propagation. We furthermore propose accuracy improvement algorithms and a fast yield calculation method. The proposed method shows accuracy improvement combined with a 100-fold reduction in run-time with respect to a 1000-sample Monte Carlo analysis.
Citation:
Rasit Onur Topaloglu, "Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations," vts, pp.136-142, 24th IEEE VLSI Test Symposium, 2006