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24th IEEE VLSI Test Symposium
Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations
Berkeley, California
April 30-May 04
ISBN: 0-7695-2514-8
Rasit Onur Topaloglu, University of California at San Diego
Monte Carlo analysis has so far been the corner stone for analog statistical simulations. Fast and accurate simulations are necessary for stringent time-to-market, design for manufacturability and yield concerns in the analog domain. Although Monte Carlo attains accuracy, it does so with a sacrifice in run-time for analog simulations. In this paper, we propose a fast and accurate probabilistic simulation method alternative to Monte Carlo using deterministic sampling and weight propagation. We furthermore propose accuracy improvement algorithms and a fast yield calculation method. The proposed method shows accuracy improvement combined with a 100-fold reduction in run-time with respect to a 1000-sample Monte Carlo analysis.
Citation:
Rasit Onur Topaloglu, "Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations," vts, pp.136-142, 24th IEEE VLSI Test Symposium, 2006
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