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24th IEEE VLSI Test Symposium
Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction
Berkeley, California
April 30-May 04
ISBN: 0-7695-2514-8
ASCII Text
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Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterj, "Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction," VLSI Test Symposium, IEEE, pp. 208-213, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
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@article{ 10.1109/VTS.2006.27,
author = {Maryam Ashouei and Soumendu Bhattacharya and Abhijit Chatterj},
title = {Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {208-213},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.27},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction
SN - 0-7695-2514-8
SP208
EP213
A1 - Maryam Ashouei,
A1 - Soumendu Bhattacharya,
A1 - Abhijit Chatterj,
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Maryam Ashouei, Georgia Institute of Technology
Soumendu Bhattacharya, Georgia Institute of Technology
Abhijit Chatterj, Georgia Institute of Technology
Any error detecting or correcting code must meet specific code distance criteria to be able to detect and correct specified numbers of errors. Prior work in the area of error detection and correction in linear digital systems using real number checksum codes has shown that at least two checksums are necessary for error correction in linear digital filters and that a fair amount of computation on the two checksums must be performed before "perfect" error compensation can be achieved. In this paper, it is shown that a single checksum can be used to perform probabilistic error correction in linear digital filters with the objective of improving filter SNR in the presence of repetitive injected errors. This approach is designed to partially correct the errors. Comparison against a system with no error correction shows up to 7 dB SNR improvement using the proposed method.
Citation:
Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterj, "Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction," vts, pp.208-213, 24th IEEE VLSI Test Symposium, 2006
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