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24th IEEE VLSI Test Symposium
Awards (PDF)
Berkeley, California
April 30-May 04
ISBN: 0-7695-2514-8
ASCII Text
x 
 
"Awards," VLSI Test Symposium, IEEE, pp. xxvii-xxix, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2006.21,
author = {},
title = {Awards},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {xxvii-xxix},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.21},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Awards
SN - 0-7695-2514-8
SPxxvii
EPxxix
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Awards," vts, pp.xxvii-xxix, 24th IEEE VLSI Test Symposium, 2006
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