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24th IEEE VLSI Test Symposium
An Overview of Failure Mechanisms in Embedded Flash Memories
Berkeley, California
April 30-May 04
ISBN: 0-7695-2514-8
ASCII Text
x 
 
O. Ginez, J.-M. Daga, M. Combe, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, "An Overview of Failure Mechanisms in Embedded Flash Memories," VLSI Test Symposium, IEEE, pp. 108-113, 24th IEEE VLSI Test Symposium, 2006.
 
 
BibTex
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@article{ 10.1109/VTS.2006.19,
author = {O. Ginez and J.-M. Daga and M. Combe and P. Girard and C. Landrault and S. Pravossoudovitch and A. Virazel},
title = {An Overview of Failure Mechanisms in Embedded Flash Memories},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2006},
isbn = {0-7695-2514-8},
pages = {108-113},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.19},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - An Overview of Failure Mechanisms in Embedded Flash Memories
SN - 0-7695-2514-8
SP108
EP113
A1 - O. Ginez,
A1 - J.-M. Daga,
A1 - M. Combe,
A1 - P. Girard,
A1 - C. Landrault,
A1 - S. Pravossoudovitch,
A1 - A. Virazel,
PY - 2006
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
O. Ginez, ATMEL Rousset, France
J.-M. Daga, ATMEL Rousset, France
M. Combe, ATMEL Rousset, France
P. Girard, Universit? de Montpellier, France
C. Landrault, Universit? de Montpellier, France
S. Pravossoudovitch, Universit? de Montpellier, France
A. Virazel, Universit? de Montpellier, France
Non-volatile Flash memories are becoming more and more popular for System-on-Chip design (SoC). Embedded flash (eFlash) memories are based on the floating-gate transistor concept and can be subject to complex hard defects creating functional faults. Studies of realistic failure mechanisms and their associated fault models are the first mandatory step before providing efficient and practical new test methods. In this paper, we present an analysis made on actual failures occurring in 2T FLOTOX cells of 0.15?m NOR-based embedded flash structure.
Citation:
O. Ginez, J.-M. Daga, M. Combe, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, "An Overview of Failure Mechanisms in Embedded Flash Memories," vts, pp.108-113, 24th IEEE VLSI Test Symposium, 2006
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