The test of high resolution Sigma-Delta Analogueto- Digital Converters (\Sigma\Delta ADCs) is a costly task due to its high resolution and the large number of samples required. In this paper, we propose a Built-In Self-Test (BIST) technique for the test of SNDR (Signal-to-Noise plus Distortion Ratio) in \Sigma\Delta ADCs. The technique, mostly digital, uses a binary stream as test stimulus and carries out a sine-wave fitting algorithm to analyse the output response. Both the test signal generation and the output response analysis are performed on-chip, taking advantage of the digital resources already present in a \Sigma\Delta ADC. Simulations results show the capability of this technique to obtain measures of the SNDR for a 16-bit audio \Sigma\Delta ADC.