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23rd IEEE VLSI Test Symposium (VTS'05)
Towards an Understanding of No Trouble Found Devices
Palm Springs, California
May 01-May 05
ISBN: 0-7695-2314-5
ASCII Text
x 
 
Scott Davidson, "Towards an Understanding of No Trouble Found Devices," VLSI Test Symposium, IEEE, pp. 147-152, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2005.86,
author = {Scott Davidson},
title = {Towards an Understanding of No Trouble Found Devices},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2005},
issn = {1093-0167},
pages = {147-152},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.86},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Towards an Understanding of No Trouble Found Devices
SN - 1093-0167
SP147
EP152
A1 - Scott Davidson,
PY - 2005
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Scott Davidson, Sun Microsystems, Inc.
This paper gives a model for understanding no trouble found (NTF) parts, including predictions of how many can be expected at different stages of a product life cycle, an understanding of when NTFs are of concern, and when they are to be expected. We also show how NTF rates can be used as a measure of process health.
Citation:
Scott Davidson, "Towards an Understanding of No Trouble Found Devices," vts, pp.147-152, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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