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23rd IEEE VLSI Test Symposium (VTS'05)
Palm Springs, California
May 01-May 05
ISBN: 0-7695-2314-5
ASCII Text
x 
 
"Test Technology Technical Council," VLSI Test Symposium, IEEE, pp. xix-xxi, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
 
 
BibTex
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@article{ 10.1109/VTS.2005.84,
author = {},
title = {Test Technology Technical Council},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2005},
issn = {1093-0167},
pages = {xix-xxi},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.84},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Technology Technical Council
SN - 1093-0167
SPxix
EPxxi
PY - 2005
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Test Technology Technical Council," vts, pp.xix-xxi, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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