"Test Technology Educational Program: Overview of Tutorials," VLSI Test Symposium, IEEE, pp. xxii-xxv, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.

@article{ 10.1109/VTS.2005.83,
author = {},
title = {Test Technology Educational Program: Overview of Tutorials},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2005},
issn = {1093-0167},
pages = {xxii-xxv},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.83},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Technology Educational Program: Overview of Tutorials
SN - 1093-0167
SPxxii
EPxxv
PY - 2005
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -