Program Committee

V
VTS
2005
23rd IEEE VLSI Test Symposium (VTS'05)
Abstract - Program Committee

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23rd IEEE VLSI Test Symposium (VTS'05)

Program Committee (PDF)

Palm Springs, California

May 01-May 05

ISBN: 0-7695-2314-5

	ASCII Text	x
	"Program Committee," VLSI Test Symposium, IEEE, pp. xv, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.

	BibTex	x
	@article{ 10.1109/VTS.2005.68, author = {}, title = {Program Committee}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2005}, issn = {1093-0167}, pages = {xv}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.68}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Program Committee SN - 1093-0167 SP EP PY - 2005 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2005.68

Citation:

"Program Committee," vts, pp.xv, 23rd IEEE VLSI Test Symposium (VTS'05), 2005

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