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23rd IEEE VLSI Test Symposium (VTS'05)
On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor
Palm Springs, California
May 01-May 05
ISBN: 0-7695-2314-5
ASCII Text
x 
 
N. Dumas, F. Aza?, L. Latorre, P. Nouet, "On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor," VLSI Test Symposium, IEEE, pp. 213-218, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2005.62,
author = {N. Dumas and F. Aza? and L. Latorre and P. Nouet},
title = {On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2005},
issn = {1093-0167},
pages = {213-218},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.62},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor
SN - 1093-0167
SP213
EP218
A1 - N. Dumas,
A1 - F. Aza?,
A1 - L. Latorre,
A1 - P. Nouet,
PY - 2005
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
N. Dumas, Universite Montpellier II/CNRS
F. Aza?, Universite Montpellier II/CNRS
L. Latorre, Universite Montpellier II/CNRS
P. Nouet, Universite Montpellier II/CNRS
This paper introduces some practical BIST solutions as a basis for a future self-testable MEMS-based magnetic field sensor. It is demonstrated that slight modifications of the system architecture can be used to allow both on-chip generation of electro-thermal stimuli and pre-processing of the sensor response. The external response analysis and thus the test procedure are then strongly simplified and require only a standard digital automatic test equipment.
Citation:
N. Dumas, F. Aza?, L. Latorre, P. Nouet, "On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic Field Sensor," vts, pp.213-218, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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