Minimal March Tests for Unlinked Static Faults in Random Access Memories

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23rd IEEE VLSI Test Symposium (VTS'05)

Palm Springs, California

May 01-May 05

ISBN: 0-7695-2314-5

	ASCII Text	x
	G. Harutunyan, V. A. Vardanian, Y. Zorian, "Minimal March Tests for Unlinked Static Faults in Random Access Memories," VLSI Test Symposium, IEEE, pp. 53-59, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.

	BibTex	x
	@article{ 10.1109/VTS.2005.56, author = {G. Harutunyan and V. A. Vardanian and Y. Zorian}, title = {Minimal March Tests for Unlinked Static Faults in Random Access Memories}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2005}, issn = {1093-0167}, pages = {53-59}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.56}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Minimal March Tests for Unlinked Static Faults in Random Access Memories SN - 1093-0167 SP53 EP59 A1 - G. Harutunyan, A1 - V. A. Vardanian, A1 - Y. Zorian, PY - 2005 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

G. Harutunyan, Virage Logic

V. A. Vardanian, Virage Logic

Y. Zorian, Virage Logic

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2005.56

New minimal March test algorithms are proposed for detection of (all) unlinked static faults in Random Access Memories. In particular, a new minimal March MSS test of complexity 18N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).

Citation:

G. Harutunyan, V. A. Vardanian, Y. Zorian, "Minimal March Tests for Unlinked Static Faults in Random Access Memories," vts, pp.53-59, 23rd IEEE VLSI Test Symposium (VTS'05), 2005

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