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23rd IEEE VLSI Test Symposium (VTS'05)
Minimal March Tests for Unlinked Static Faults in Random Access Memories
Palm Springs, California
May 01-May 05
ISBN: 0-7695-2314-5
ASCII Text
x 
 
G. Harutunyan, V. A. Vardanian, Y. Zorian, "Minimal March Tests for Unlinked Static Faults in Random Access Memories," VLSI Test Symposium, IEEE, pp. 53-59, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2005.56,
author = {G. Harutunyan and V. A. Vardanian and Y. Zorian},
title = {Minimal March Tests for Unlinked Static Faults in Random Access Memories},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2005},
issn = {1093-0167},
pages = {53-59},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.56},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Minimal March Tests for Unlinked Static Faults in Random Access Memories
SN - 1093-0167
SP53
EP59
A1 - G. Harutunyan,
A1 - V. A. Vardanian,
A1 - Y. Zorian,
PY - 2005
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
G. Harutunyan, Virage Logic
V. A. Vardanian, Virage Logic
Y. Zorian, Virage Logic
New minimal March test algorithms are proposed for detection of (all) unlinked static faults in Random Access Memories. In particular, a new minimal March MSS test of complexity 18N is introduced detecting all realistic simple static faults, as March SS (22N), (S. Hamdioui, van de Goor, Rodgers, MTDT 2002).
Citation:
G. Harutunyan, V. A. Vardanian, Y. Zorian, "Minimal March Tests for Unlinked Static Faults in Random Access Memories," vts, pp.53-59, 23rd IEEE VLSI Test Symposium (VTS'05), 2005
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