Meeting the Test Challenges of the 1 Gbps Parallel RapidIO? Interface with New Automatic Test Equipment Capabilities

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23rd IEEE VLSI Test Symposium (VTS'05)

Palm Springs, California

May 01-May 05

ISBN: 0-7695-2314-5

	ASCII Text	x
	Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt, "Meeting the Test Challenges of the 1 Gbps Parallel RapidIO? Interface with New Automatic Test Equipment Capabilities," VLSI Test Symposium, IEEE, pp. 75-84, 23rd IEEE VLSI Test Symposium (VTS'05), 2005.

	BibTex	x
	@article{ 10.1109/VTS.2005.55, author = {Darren Aaberge and Ken Mockler and Dieu Van Dinh and Raoul Belleau and Tim Donovan and Reid Hewlitt}, title = {Meeting the Test Challenges of the 1 Gbps Parallel RapidIO? Interface with New Automatic Test Equipment Capabilities}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2005}, issn = {1093-0167}, pages = {75-84}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.55}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Meeting the Test Challenges of the 1 Gbps Parallel RapidIO? Interface with New Automatic Test Equipment Capabilities SN - 1093-0167 SP75 EP84 A1 - Darren Aaberge, A1 - Ken Mockler, A1 - Dieu Van Dinh, A1 - Raoul Belleau, A1 - Tim Donovan, A1 - Reid Hewlitt, PY - 2005 KW - RapidIO KW - Source-Synchronous KW - ATE KW - LVDS KW - Differential KW - Non-determinism VL - 0 JA - VLSI Test Symposium, IEEE ER -

Darren Aaberge, Freescale Semiconductor, Inc.

Ken Mockler, Freescale Semiconductor, Inc.

Dieu Van Dinh, Freescale Semiconductor, Inc.

Raoul Belleau, Teradyne, Inc.

Tim Donovan, Teradyne, Inc.

Reid Hewlitt, Teradyne, Inc.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2005.55

This paper describes an approach to testing the 1Gbps Parallel RapidIO? interface specifications. The unique test requirements for this bus require the application of new test techniques as well as new ATE capabilities. ATE performance attributes important for parallel source-synchronous buses will be identified and presented with methods to measure these attributes.

Index Terms:

RapidIO, Source-Synchronous, ATE, LVDS, Differential, Non-determinism

Citation:

Darren Aaberge, Ken Mockler, Dieu Van Dinh, Raoul Belleau, Tim Donovan, Reid Hewlitt, "Meeting the Test Challenges of the 1 Gbps Parallel RapidIO? Interface with New Automatic Test Equipment Capabilities," vts, pp.75-84, 23rd IEEE VLSI Test Symposium (VTS'05), 2005

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