"Invited Keynote: Building Yield into Systems-on-Chips for Nanometer Technologies," VLSI Test Symposium, IEEE, pp. 4, 21st IEEE VLSI Test Symposium, 2003.

@article{ 10.1109/VTS.2003.10008,
author = {},
title = {Invited Keynote: Building Yield into Systems-on-Chips for Nanometer Technologies},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2003},
issn = {1093-0167},
pages = {4},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2003.10008},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Invited Keynote: Building Yield into Systems-on-Chips for Nanometer Technologies
SN - 1093-0167
SP
EP
PY - 2003
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -