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21st IEEE VLSI Test Symposium
Napa Valley, California
April 27-May 01
ISBN: 0-7695-1924-5
ASCII Text
x 
 
"Test Technology Educational Programs: Overview of Tutorials," VLSI Test Symposium, IEEE, pp. xxiv, 21st IEEE VLSI Test Symposium, 2003.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2003.10002,
author = {},
title = {Test Technology Educational Programs: Overview of Tutorials},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2003},
issn = {1093-0167},
pages = {xxiv},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2003.10002},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Technology Educational Programs: Overview of Tutorials
SN - 1093-0167
SP
EP
PY - 2003
KW - null
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Test Technology Educational Programs: Overview of Tutorials," vts, pp.xxiv, 21st IEEE VLSI Test Symposium, 2003
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