J. Borel, Anand Raghunathan, Jim Sproch, Michael Howells, Janusz Rajski, "Innovations in Test Automation," VLSI Test Symposium, IEEE, pp. 0043, 20th IEEE VLSI Test Symposium, 2002.

@article{ 10.1109/VTS.2002.1011109,
author = {J. Borel and Anand Raghunathan and Jim Sproch and Michael Howells and Janusz Rajski},
title = {Innovations in Test Automation},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {0043},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011109},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Innovations in Test Automation
SN - 0-7695-1570-3
SP
EP
A1 - J. Borel,
A1 - Anand Raghunathan,
A1 - Jim Sproch,
A1 - Michael Howells,
A1 - Janusz Rajski,
PY - 2002
VL - 0
JA - VLSI Test Symposium, IEEE
ER -