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20th IEEE VLSI Test Symposium
Monterey, California
April 28-May 02
ISBN: 0-7695-1570-3
ASCII Text
x 
 
"Test Technology Educational Program: Overview of Tutorials," VLSI Test Symposium, IEEE, pp. xxx, 20th IEEE VLSI Test Symposium, 2002.
 
 
BibTex
x
 
@article{ 10.1109/VTS.2002.10007,
author = {},
title = {Test Technology Educational Program: Overview of Tutorials},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {xxx},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.10007},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Technology Educational Program: Overview of Tutorials
SN - 0-7695-1570-3
SP
EP
PY - 2002
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Test Technology Educational Program: Overview of Tutorials," vts, pp.xxx, 20th IEEE VLSI Test Symposium, 2002
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