Jai K. Hakhu, "Plenary Address: Business and Technical Challenges for Testing the Ghz Age," VLSI Test Symposium, IEEE, pp. xxxvii, 20th IEEE VLSI Test Symposium, 2002.

@article{ 10.1109/VTS.2002.10000,
author = {Jai K. Hakhu},
title = {Plenary Address: Business and Technical Challenges for Testing the Ghz Age},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2002},
isbn = {0-7695-1570-3},
pages = {xxxvii},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2002.10000},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Plenary Address: Business and Technical Challenges for Testing the Ghz Age
SN - 0-7695-1570-3
SP
EP
A1 - Jai K. Hakhu,
PY - 2002
VL - 0
JA - VLSI Test Symposium, IEEE
ER -