loading...
 This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
19th IEEE VLSI Test Symposium
Design Diversity for Concurrent Error Detection in Sequential Logic Circuts
Marina Del Rey, CA
March 29-April 03
ISBN: 0-7695-1122-8
Subhasish Mitra, Stanford University
Edward J. McCluskey, Stanford University
We present a technique using diverse duplication to implement concurrent error detection (CED) in sequential logic circuits. We examine three different approaches for this purpose: (1) Identical state encoding of the two sequential logic implementations, duplication of flip-flops, diverse implementation of the combinational logic part (output logic and next-state logic) and comparators on flip-flop outputs and primary outputs; (2) Diverse state encoding of the two implementations, duplication of flip-flops, diverse combinational logic implementation and comparators on primary outputs only; and (3) Identical state encoding, parity prediction for the flip-flops, diverse combinational logic implementation, comparators on primary outputs and parity checkers on flip-flop outputs. Our results for the simulated sequential benchmark circuits demonstrate that the third approach is most efficient in protecting sequential logic circuits against multiple and common-mode failures. The computational complexity of the data integrity analysis of the third approach is of the same order as that of the first approach and is at least an order of magnitude less than that of the second approach.
Citation:
Subhasish Mitra, Edward J. McCluskey, "Design Diversity for Concurrent Error Detection in Sequential Logic Circuts," vts, pp.0178, 19th IEEE VLSI Test Symposium, 2001
Usage of this product signifies your acceptance of the Terms of Use.