Compression Technique for Interactive BIST Application

V
VTS
2001
19th IEEE VLSI Test Symposium
Abstract - Compression Technique for Interactive BIST Application

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	Similar Articles Articles by Douglas Kay Articles by Inc. Cisco Systems Articles by Samiha Mourad

19th IEEE VLSI Test Symposium

Marina Del Rey, CA

March 29-April 03

ISBN: 0-7695-1122-8

	ASCII Text	x
	Douglas Kay, Inc. Cisco Systems, Samiha Mourad, "Compression Technique for Interactive BIST Application," VLSI Test Symposium, IEEE, pp. 0009, 19th IEEE VLSI Test Symposium, 2001.

	BibTex	x
	@article{ 10.1109/VTS.2001.923411, author = {Douglas Kay and Inc. Cisco Systems and Samiha Mourad}, title = {Compression Technique for Interactive BIST Application}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2001}, isbn = {0-7695-1122-8}, pages = {0009}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923411}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Compression Technique for Interactive BIST Application SN - 0-7695-1122-8 SP EP A1 - Douglas Kay, A1 - Inc. Cisco Systems, A1 - Samiha Mourad, PY - 2001 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Douglas Kay, Santa Clara University

Inc. Cisco Systems

Samiha Mourad, Santa Clara University

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923411

This paper presents a compression technique that reduces the test data volume while achieving high fault coverage within a Built-In Self-Test environment. The LFSR control data target only the RPR faults. The data are further reduced using a new code. Analysis of essential attributes of the control data is performed to assess their effect on the compression technique. The scheme was applied to several benchmark cores and indicated a superior effect than previously used compression techniques.

Citation:

Douglas Kay, Inc. Cisco Systems, Samiha Mourad, "Compression Technique for Interactive BIST Application," vts, pp.0009, 19th IEEE VLSI Test Symposium, 2001

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