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19th IEEE VLSI Test Symposium
Compression Technique for Interactive BIST Application
Marina Del Rey, CA
March 29-April 03
ISBN: 0-7695-1122-8
ASCII Text
x 
 
Douglas Kay, Inc. Cisco Systems, Samiha Mourad, "Compression Technique for Interactive BIST Application," VLSI Test Symposium, IEEE, pp. 0009, 19th IEEE VLSI Test Symposium, 2001.
 
 
BibTex
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@article{ 10.1109/VTS.2001.923411,
author = {Douglas Kay and Inc. Cisco Systems and Samiha Mourad},
title = {Compression Technique for Interactive BIST Application},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2001},
isbn = {0-7695-1122-8},
pages = {0009},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2001.923411},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Compression Technique for Interactive BIST Application
SN - 0-7695-1122-8
SP
EP
A1 - Douglas Kay,
A1 - Inc. Cisco Systems,
A1 - Samiha Mourad,
PY - 2001
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Douglas Kay, Santa Clara University
Samiha Mourad, Santa Clara University
This paper presents a compression technique that reduces the test data volume while achieving high fault coverage within a Built-In Self-Test environment. The LFSR control data target only the RPR faults. The data are further reduced using a new code. Analysis of essential attributes of the control data is performed to assess their effect on the compression technique. The scheme was applied to several benchmark cores and indicated a superior effect than previously used compression techniques.
Citation:
Douglas Kay, Inc. Cisco Systems, Samiha Mourad, "Compression Technique for Interactive BIST Application," vts, pp.0009, 19th IEEE VLSI Test Symposium, 2001
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