Program Committee

V
VTS
2000
18th IEEE VLSI Test Symposium (VTS'00)
Abstract - Program Committee

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18th IEEE VLSI Test Symposium (VTS'00)

Program Committee (PDF)

Montreal, Canada

April 30-May 04

ISBN: 0-7695-0613-5

	ASCII Text	x
	"Program Committee," VLSI Test Symposium, IEEE, pp. xix, 18th IEEE VLSI Test Symposium (VTS'00), 2000.

	BibTex	x
	@article{ 10.1109/VTS.2000.10011, author = {}, title = {Program Committee}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2000}, issn = {1093-0167}, pages = {xix}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.2000.10011}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Program Committee SN - 1093-0167 SP EP PY - 2000 VL - 0 JA - VLSI Test Symposium, IEEE ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.2000.10011

Citation:

"Program Committee," vts, pp.xix, 18th IEEE VLSI Test Symposium (VTS'00), 2000

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