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1999 17TH IEEE VLSI Test Symposium
San Diego, California
April 26-April 30
ISBN: 0-7695-0146-X
ASCII Text
x 
 
"Test Technology Technical Council," VLSI Test Symposium, IEEE, pp. xix, 1999 17TH IEEE VLSI Test Symposium, 1999.
 
 
BibTex
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@article{ 10.1109/VTS.1999.10001,
author = {},
title = {Test Technology Technical Council},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1999},
issn = {1093-0167},
pages = {xix},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1999.10001},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Technology Technical Council
SN - 1093-0167
SP
EP
PY - 1999
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Test Technology Technical Council," vts, pp.xix, 1999 17TH IEEE VLSI Test Symposium, 1999
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