Y. Zorian, V. Rayapati, J. Miranda, S. Davidson, P. Dziel, S. Adham, S. Millman, "Test Reuse at System Level," VLSI Test Symposium, IEEE, pp. 318, 16th IEEE VLSI Test Symposium, 1998.

@article{ 10.1109/VTS.1998.10014,
author = {Y. Zorian and V. Rayapati and J. Miranda and S. Davidson and P. Dziel and S. Adham and S. Millman},
title = {Test Reuse at System Level},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {318},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1998.10014},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test Reuse at System Level
SN - 1093-0167
SP
EP
A1 - Y. Zorian,
A1 - V. Rayapati,
A1 - J. Miranda,
A1 - S. Davidson,
A1 - P. Dziel,
A1 - S. Adham,
A1 - S. Millman,
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -