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16th IEEE VLSI Test Symposium
Reviewers (PDF)
Monterey, California
April 26-April 30
ISBN: 0-8186-8436-4
ASCII Text
x 
 
"Reviewers," VLSI Test Symposium, IEEE, pp. xxiii, 16th IEEE VLSI Test Symposium, 1998.
 
 
BibTex
x
 
@article{ 10.1109/VTS.1998.10008,
author = {},
title = {Reviewers},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1998},
issn = {1093-0167},
pages = {xxiii},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1998.10008},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Reviewers
SN - 1093-0167
SP
EP
PY - 1998
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Reviewers," vts, pp.xxiii, 16th IEEE VLSI Test Symposium, 1998
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