Test Technology Technical Committee

V
VTS
1998
16th IEEE VLSI Test Symposium
Abstract - Test Technology Technical Committee

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16th IEEE VLSI Test Symposium

Test Technology Technical Committee (PDF)

Monterey, California

April 26-April 30

ISBN: 0-8186-8436-4

	ASCII Text	x
	"Test Technology Technical Committee," VLSI Test Symposium, IEEE, pp. xix, 16th IEEE VLSI Test Symposium, 1998.

	BibTex	x
	@article{ 10.1109/VTS.1998.10001, author = {}, title = {Test Technology Technical Committee}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1998}, issn = {1093-0167}, pages = {xix}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1998.10001}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Technology Technical Committee SN - 1093-0167 SP EP PY - 1998 VL - 0 JA - VLSI Test Symposium, IEEE ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.1998.10001

Citation:

"Test Technology Technical Committee," vts, pp.xix, 16th IEEE VLSI Test Symposium, 1998

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