Gadi Singer, General Manager, Design Technology, Intel Corporation,
"Current Trends and Future Directions in Test and DFT,"
VLSI Test Symposium, IEEE, pp. xxx, 15th IEEE VLSI Test Symposium (VTS'97), 1997.
BibTex
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@article{
10.1109/VTS.1997.10016, author = {Gadi Singer and General Manager and Design Technology and Intel Corporation}, title = {Current Trends and Future Directions in Test and DFT}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {xxx}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1997.10016}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }
RefWorks Procite/RefMan/Endnote
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TY - CONF JO - VLSI Test Symposium, IEEE TI - Current Trends and Future Directions in Test and DFT SN - 0-8186-7810-0 SP EP A1 - Gadi Singer, A1 - General Manager, A1 - Design Technology, A1 - Intel Corporation, PY - 1997 VL - 0 JA - VLSI Test Symposium, IEEE ER -
Gadi Singer, General Manager, Design Technology, Intel Corporation, "Current Trends and Future Directions in Test and DFT," vts, pp.xxx, 15th IEEE VLSI Test Symposium (VTS'97), 1997
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