Gadi Singer, General Manager, Design Technology, Intel Corporation, "Current Trends and Future Directions in Test and DFT," VLSI Test Symposium, IEEE, pp. xxx, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

@article{ 10.1109/VTS.1997.10016,
author = {Gadi Singer and General Manager and Design Technology and Intel Corporation},
title = {Current Trends and Future Directions in Test and DFT},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1997},
isbn = {0-8186-7810-0},
pages = {xxx},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1997.10016},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Current Trends and Future Directions in Test and DFT
SN - 0-8186-7810-0
SP
EP
A1 - Gadi Singer,
A1 - General Manager,
A1 - Design Technology,
A1 - Intel Corporation,
PY - 1997
VL - 0
JA - VLSI Test Symposium, IEEE
ER -