Gary Smith, Principal Analyst Dataquest, "Test and System Level Integration," VLSI Test Symposium, IEEE, pp. xxxii, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

@article{ 10.1109/VTS.1997.10013,
author = {Gary Smith and Principal Analyst Dataquest},
title = {Test and System Level Integration},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1997},
isbn = {0-8186-7810-0},
pages = {xxxii},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1997.10013},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}

TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Test and System Level Integration
SN - 0-8186-7810-0
SP
EP
A1 - Gary Smith,
A1 - Principal Analyst Dataquest,
PY - 1997
VL - 0
JA - VLSI Test Symposium, IEEE
ER -