Test Technology Technical Committee

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15th IEEE VLSI Test Symposium (VTS'97)

Monterey, California

April 27-May 01

ISBN: 0-8186-7810-0

	ASCII Text	x
	"Test Technology Technical Committee," VLSI Test Symposium, IEEE, pp. xvii, 15th IEEE VLSI Test Symposium (VTS'97), 1997.

	BibTex	x
	@article{ 10.1109/VTS.1997.10004, author = {}, title = {Test Technology Technical Committee}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1997}, isbn = {0-8186-7810-0}, pages = {xvii}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1997.10004}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Test Technology Technical Committee SN - 0-8186-7810-0 SP EP PY - 1997 VL - 0 JA - VLSI Test Symposium, IEEE ER -

Citation:

"Test Technology Technical Committee," vts, pp.xvii, 15th IEEE VLSI Test Symposium (VTS'97), 1997

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