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15th IEEE VLSI Test Symposium (VTS'97)
Monterey, California
April 27-May 01
ISBN: 0-8186-7810-0
ASCII Text
x 
 
"Best Panel Award 96," VLSI Test Symposium, IEEE, pp. xxiii, 15th IEEE VLSI Test Symposium (VTS'97), 1997.
 
 
BibTex
x
 
@article{ 10.1109/VTS.1997.10000,
author = {},
title = {Best Panel Award 96},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {1997},
isbn = {0-8186-7810-0},
pages = {xxiii},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1997.10000},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Best Panel Award 96
SN - 0-8186-7810-0
SP
EP
PY - 1997
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
Citation:
"Best Panel Award 96," vts, pp.xxiii, 15th IEEE VLSI Test Symposium (VTS'97), 1997
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