Best Paper Award

V
VTS
1995
13th IEEE VLSI Test Symposium (VTS'95)
Abstract - Best Paper Award

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13th IEEE VLSI Test Symposium (VTS'95)

Best Paper Award (PDF)

Princeton, New Jersey

April 30-May 03

ISBN: 0-8186-7000-2

	ASCII Text	x
	"Best Paper Award," VLSI Test Symposium, IEEE, pp. xx, 13th IEEE VLSI Test Symposium (VTS'95), 1995.

	BibTex	x
	@article{ 10.1109/VTS.1995.10000, author = {}, title = {Best Paper Award}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {1995}, isbn = {0-8186-7000-2}, pages = {xx}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTS.1995.10000}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Best Paper Award SN - 0-8186-7000-2 SP EP PY - 1995 VL - 0 JA - VLSI Test Symposium, IEEE ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTS.1995.10000

Citation:

"Best Paper Award," vts, pp.xx, 13th IEEE VLSI Test Symposium (VTS'95), 1995

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