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22nd IEEE VLSI Test Symposium
Sensing temperature in CMOS circuits for Thermal Testing
Napa Valley, California
April 25-April 29
ISBN: 0-7695-2134-7
ASCII Text
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J. Altet, A. Rubio, A. Salhi, J. L. G?lvez, S. Dilhaire, A. Syal, A. Ivanov, "Sensing temperature in CMOS circuits for Thermal Testing," VLSI Test Symposium, IEEE, pp. 179, 22nd IEEE VLSI Test Symposium, 2004.
 
 
BibTex
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@article{ 10.1109/VTEST.2004.1299241,
author = {J. Altet and A. Rubio and A. Salhi and J. L. G?lvez and S. Dilhaire and A. Syal and A. Ivanov},
title = {Sensing temperature in CMOS circuits for Thermal Testing},
journal ={VLSI Test Symposium, IEEE},
volume = {0},
year = {2004},
issn = {1093-0167},
pages = {179},
doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299241},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - VLSI Test Symposium, IEEE
TI - Sensing temperature in CMOS circuits for Thermal Testing
SN - 1093-0167
SP
EP
A1 - J. Altet,
A1 - A. Rubio,
A1 - A. Salhi,
A1 - J. L. G?lvez,
A1 - S. Dilhaire,
A1 - A. Syal,
A1 - A. Ivanov,
PY - 2004
KW - Thermal testing
KW - temperature sensors
KW - analysis failure
KW - built-in self test
VL - 0
JA - VLSI Test Symposium, IEEE
ER -
 
J. Altet, Universitat Polit?cnica de Catalunya, Barcelona, Spain
A. Rubio, Universitat Polit?cnica de Catalunya, Barcelona, Spain
A. Salhi, Universit? Bordeaux I, Bordeaux, France
J. L. G?lvez, Universitat Polit?cnica de Catalunya, Barcelona, Spain
S. Dilhaire, Universit? Bordeaux I, Bordeaux, France
A. Syal, The University of British Columbia. Vancouver. Canada
A. Ivanov, The University of British Columbia. Vancouver. Canada
Temperature is a physical magnitude that can be used as an observable quantity for IC testing purposes. The authors discuss in this paper the suitability of two temperature measuring strategies applicable to standard CMOS integrated circuits: a laser interferometer and a differential fully CMOS built-in temperature sensor.
Index Terms:
Thermal testing, temperature sensors, analysis failure, built-in self test
Citation:
J. Altet, A. Rubio, A. Salhi, J. L. G?lvez, S. Dilhaire, A. Syal, A. Ivanov, "Sensing temperature in CMOS circuits for Thermal Testing," vts, pp.179, 22nd IEEE VLSI Test Symposium, 2004
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