3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme

V
VTS
2004
22nd IEEE VLSI Test Symposium
Abstract - 3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme

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	Similar Articles Articles by C. V. Krishna Articles by Nur A. Touba

22nd IEEE VLSI Test Symposium

Napa Valley, California

April 25-April 29

ISBN: 0-7695-2134-7

	ASCII Text	x
	C. V. Krishna, Nur A. Touba, "3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme," VLSI Test Symposium, IEEE, pp. 79, 22nd IEEE VLSI Test Symposium, 2004.

	BibTex	x
	@article{ 10.1109/VTEST.2004.1299229, author = {C. V. Krishna and Nur A. Touba}, title = {3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2004}, issn = {1093-0167}, pages = {79}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299229}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - 3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme SN - 1093-0167 SP EP A1 - C. V. Krishna, A1 - Nur A. Touba, PY - 2004 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

C. V. Krishna, University of Texas, Austin

Nur A. Touba, University of Texas, Austin

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299229

This paper presents a 3-stage continuous-flow linear decompression scheme for scan vectors that uses a variable number of bits to encode each vector. By using 3-stages of decompression, it can efficiently compress any test cube (i.e., deterministic test vector where the unassigned bit positions are left as don't cares) regardless of the number of specified (care) bits. As a result of this feature, there is no need for any constraints on the automatic test generation process (ATPG) process. Any ATPG can be used with any amount of static or dynamic compaction. Experimental results are shown which demonstrate that the proposed scheme achieves extremely high encoding efficiency.

Citation:

C. V. Krishna, Nur A. Touba, "3-Stage Variable Length Continuous-Flow Scan Vector Decompression Scheme," vts, pp.79, 22nd IEEE VLSI Test Symposium, 2004

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