On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set

V
VTS
2004
22nd IEEE VLSI Test Symposium
Abstract - On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set

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	Similar Articles Articles by Sagar Sabade Articles by D. M. H. Walker

22nd IEEE VLSI Test Symposium

Napa Valley, California

April 25-April 29

ISBN: 0-7695-2134-7

	ASCII Text	x
	Sagar Sabade, D. M. H. Walker, "On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set," VLSI Test Symposium, IEEE, pp. 65, 22nd IEEE VLSI Test Symposium, 2004.

	BibTex	x
	@article{ 10.1109/VTEST.2004.1299227, author = {Sagar Sabade and D. M. H. Walker}, title = {On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2004}, issn = {1093-0167}, pages = {65}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299227}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set SN - 1093-0167 SP EP A1 - Sagar Sabade, A1 - D. M. H. Walker, PY - 2004 KW - null VL - 0 JA - VLSI Test Symposium, IEEE ER -

Sagar Sabade, Texas A&M University, College Station

D. M. H. Walker, Texas A&M University, College Station

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2004.1299227

I{DDQ} test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of Neighbor Current Ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of I{DDQ} test, there is a strong motivation to reduce the number of test vectors without compromising the fault coverage. In this paper, we examine the effectiveness of Neighbor Current Ratio using a reduced I{DDQ} vector set and industrial test data.

Citation:

Sagar Sabade, D. M. H. Walker, "On Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set," vts, pp.65, 22nd IEEE VLSI Test Symposium, 2004

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