Measurement of Phase and Frequency Variations in Radio-Frequency Signals

V
VTS
2003
21st IEEE VLSI Test Symposium
Abstract - Measurement of Phase and Frequency Variations in Radio-Frequency Signals

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21st IEEE VLSI Test Symposium

Napa Valley, California

April 27-May 01

ISBN: 0-7695-1924-5

	ASCII Text	x
	Mani Soma, Welela Haileselassie, Jessica Sherrid, "Measurement of Phase and Frequency Variations in Radio-Frequency Signals," VLSI Test Symposium, IEEE, pp. 203, 21st IEEE VLSI Test Symposium, 2003.

	BibTex	x
	@article{ 10.1109/VTEST.2003.1197652, author = {Mani Soma and Welela Haileselassie and Jessica Sherrid}, title = {Measurement of Phase and Frequency Variations in Radio-Frequency Signals}, journal ={VLSI Test Symposium, IEEE}, volume = {0}, year = {2003}, issn = {1093-0167}, pages = {203}, doi = {http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197652}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - VLSI Test Symposium, IEEE TI - Measurement of Phase and Frequency Variations in Radio-Frequency Signals SN - 1093-0167 SP EP A1 - Mani Soma, A1 - Welela Haileselassie, A1 - Jessica Sherrid, PY - 2003 KW - Analog & RF Testing KW - Telecommunication Test KW - Non-stationary Signals VL - 0 JA - VLSI Test Symposium, IEEE ER -

Mani Soma, University of Washington, Seattle

Welela Haileselassie, University of Washington, Seattle

Jessica Sherrid, University of Washington, Seattle

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/VTEST.2003.1197652

A method to measure time-varying phase and frequency of radio-frequency signals using the Morlet transform is presented. The theoretical analysis and simulation results show that the method is suitable for detecting phase jitter, phase discontinuities, and frequency contents in telecommunication signals.

Index Terms:

Analog & RF Testing, Telecommunication Test, Non-stationary Signals

Citation:

Mani Soma, Welela Haileselassie, Jessica Sherrid, "Measurement of Phase and Frequency Variations in Radio-Frequency Signals," vts, pp.203, 21st IEEE VLSI Test Symposium, 2003

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